US Patent Issued to HORIBA on Feb. 3 for "Test system, control device, test method, and test system program" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,012, issued on Feb. 3, was assigned to HORIBA LTD. (Japan).

"Test system, control device, test method, and test system program" was invented by Hiroyuki Ikeda (Kyoto, Japan) and Tatsuya Yoshimura (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system for testing a test piece that is a vehicle or a part of the vehicle including a sensor and an electronic control device including a vehicle diagnostic function that acquires an output signal from the sensor, and that makes a diagnosis of the vehicle or the part of the vehicle, the test system includes a simulation signal generation device that is provided on a line between the sensor ...