ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,554, issued on Feb. 18, was assigned to HORIBA LTD. (Kyoto, Japan).
"Elemental analysis device" was invented by Takahito Inoue (Kyoto, Japan) and Hiroshi Uchihara (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An elemental analysis device includes a first electrode and a second electrode between which a crucible MP containing a sample is nipped, and that heats the sample. The second electrode includes a second electrode main body that has a tip end having a substantially cylindrical shape, a second electrode tip, a cap that nips the second electrode tip between the cap and the second electrode main body such that a part of the second e...