ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,828, issued on July 8, was assigned to Honor Device Co. Ltd. (Shenzhen, China).
"Charging test apparatus and method" was invented by Longlong Meng (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "An embodiment of this application provides a charging test apparatus and method, where the charging test apparatus includes: a first USB interface, a second USB interface matching the first USB interface, a plurality of conductive paths, and a control module, where the first USB interface is configured to connect to an electronic device, and the second USB interface is configured to connect to a charger. The control module is separately electr...