US Patent Issued to HONOR DEVICE on July 1 for "Radio frequency conduction test method and related apparatus without a radio frequency switch test socket" (Chinese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,761, issued on July 1, was assigned to HONOR DEVICE Co. LTD. (Shenzhen, China).

"Radio frequency conduction test method and related apparatus without a radio frequency switch test socket" was invented by Wei Zhai (Shenzhen, China) and Cheng Jiang (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A radio frequency conduction test method and a test system are provided. The test method includes: moving a radio frequency test probe to a first pad of a board so as to allow a test signal on the first pad to be transmitted to the radio frequency test probe and then transmitted to a radio frequency test instrument for a radio frequency conducti...