US Patent Issued to Hong Kong Applied Science And Technology Research Institute on Dec. 30 for "Method of estimating local oscillator leakage" (Chinese, Chinese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,873, issued on Dec. 30, was assigned to Hong Kong Applied Science And Technology Research Institute Co. Ltd (Shatin, Hong Kong).

"Method of estimating local oscillator leakage" was invented by Hong Hu (Tai Po, Hong Kong), Jianping Zheng (Eastern District, Hong Kong), Xiangyu Liu (Shenzhen, China) and Yuxian Zhang (Tai Po, Hong Kong).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of estimating local oscillator leakage (LOL) for a radio frequency (RF) signal transmitter. The method comprises generating a transmitter wideband baseband signal (s(t)) with a direct current (DC) voltage element of the transmitter wideband baseband signal (s(t)) rem...