ALEXANDRIA, Va., March 12 -- United States Patent no. 12,250,443, issued on March 11, was assigned to Honeywell International Inc. (Charlotte, N.C.).
"Imaging systems and methods for data-driven apparatus inspection" was invented by Pradeep Dey (Bangalore, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for imaging are provided. For example, a system may include an imaging probe that comprises a housing, an imaging portion comprising a camera, and a processor. The housing may be mountable to an inspection window of an apparatus, providing a view into an interior portion of the apparatus with one or more rotatable components therein. The imaging portion may be (a) extendable out of th...