US Patent Issued to Honeywell International on June 24 for "Integrated photonic responsive material sensor" (Minnesota, Arizona Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,338, issued on June 24, was assigned to Honeywell International Inc. (Charlotte, N.C.).

"Integrated photonic responsive material sensor" was invented by Neal Eldrich Solmeyer (Edina, Minn.), Matthew Wade Puckett (Phoenix), Matthew Robbins (Minneapolis), Jianfeng Wu (Tucson, Ariz.) and Mary Salit (Plymouth, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems for an integrated photonic responsive material sensor are described herein. In certain embodiments, a system includes a carrier wafer that includes a cavity formed in the carrier wafer. The carrier wafer also includes a responsive waveguide coupled to the cavity, the responsive waveguide...