US Patent Issued to HON HAI PRECISION INDUSTRY on Sept. 23 for "Method for selecting a light source for illuminating defects, electronic device, and non-transitory storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,797, issued on Sept. 23, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for selecting a light source for illuminating defects, electronic device, and non-transitory storage medium" was invented by Chung-Yu Wu (New Taipei, Taiwan) and Chin-Pin Kuo (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for selecting a light source for illuminating defects, an electronic device, and a non-transitory storage medium are provided. The method includes acquire grayscale images of an object with a known defect and generates a pseudo-hyperspectral image cube based on the grayscale images, so that algori...