US Patent Issued to HON HAI PRECISION INDUSTRY on May 6 for "Image defect detection method, electronic device using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., June 10 -- United States Patent no. 12,293,502, issued on May 6, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Image defect detection method, electronic device using the same" was invented by Jung-Hao Yang (New Taipei, Taiwan), Chin-Pin Kuo (New Taipei, Taiwan), Chih-Te Lu (New Taipei, Taiwan), Tzu-Chen Lin (New Taipei, Taiwan), Wan-Jhen Lee (New Taipei, Taiwan) and Wei-Chun Wang (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting defects in products from images thereof and an electronic device applying the method inputs a defect image repair data set into an autoencoder to train the autoencoder, and generates a reconstructed...