US Patent Issued to HON HAI PRECISION INDUSTRY on May 27 for "Method for detecting appearance defects of a product and electronic device" (Taiwanese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,128, issued on May 27, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for detecting appearance defects of a product and electronic device" was invented by Wan-Jhen Lee (New Taipei, Taiwan) and Chin-Pin Kuo (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting defects in appearance of a product from images thereof, applied in an electronic device, obtains positive sample images, negative sample images, and product sample images, divides the product sample images into input image blocks, and inputs the input image blocks into a pre-trained autoencoder to obtain reconstructed image ...