US Patent Issued to HON HAI PRECISION INDUSTRY on May 20 for "Method for detecting product defect in detection image, computing device, and storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,649, issued on May 20, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for detecting product defect in detection image, computing device, and storage medium" was invented by Jung-Hao Yang (New Taipei, Taiwan), Chin-Pin Kuo (New Taipei, Taiwan), Chih-Te Lu (New Taipei, Taiwan) and Tzu-Chen Lin (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a product defect detection method, a detection image of a product is obtained. A first preset number of detection blocks are cut out from the detection image. The detection blocks are input into an auto-encoder to obtain reconstructed blocks and a mean square...