US Patent Issued to HON HAI PRECISION INDUSTRY on March 25 for "Method for detecting product for defects, electronic device, and storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,542, issued on March 25, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for detecting product for defects, electronic device, and storage medium" was invented by Guo-Chin Sun (New Taipei, Taiwan) and Chin-Pin Kuo (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a product for defects implemented in an electronic device includes detecting images of a product for defects by a first defect detection model in a preset period, and obtaining a detection result; when a ratio of the number of negative sample images is greater than a preset threshold, training an autoencoder model; o...