US Patent Issued to HON HAI PRECISION INDUSTRY on March 25 for "Method for detecting defects in images, computer device, and storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,535, issued on March 25, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for detecting defects in images, computer device, and storage medium" was invented by Tzu-Chen Lin (New Taipei, Taiwan), Tung-Tso Tsai (New Taipei, Taiwan) and Chin-Pin Kuo (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting defects in images, is employed in a computer device, and stored in a storage medium. The method trains an autoencoder model using unblemished images, inputting an image to be detected into the autoencoder model, and obtaining a reconstructed image. An image error is calculated between ...