US Patent Issued to HON HAI PRECISION INDUSTRY on March 25 for "Defect detection method, computer device and storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,537, issued on March 25, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Defect detection method, computer device and storage medium" was invented by Wan-Jhen Lee (New Taipei, Taiwan), Tung-Tso Tsai (New Taipei, Taiwan), Chin-Pin Kuo (New Taipei, Taiwan), Tzu-Chen Lin (New Taipei, Taiwan) and Guo-Chin Sun (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A product defect detection method which includes acquiring a detection image of a product to be detected is provided. The method further includes dividing the detection image into a first preset number of detection blocks. Once a detection result of each ...