US Patent Issued to HON HAI PRECISION INDUSTRY on March 11 for "Method for measuring growth height of plant, electronic device, and storage medium" (Taiwanese Inventors)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,249,086, issued on March 11, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for measuring growth height of plant, electronic device, and storage medium" was invented by Tzu-Chen Lin (New Taipei, Taiwan), Jung-Hao Yang (New Taipei, Taiwan), Chih-Te Lu (New Taipei, Taiwan) and Chin-Pin Kuo (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for measuring a growth height of a plant, an electronic device, and a storage medium are provided. The method controls a camera device to obtain a color image and a depth image of a plant to be detected. The color image is detected by a detection model which i...