ALEXANDRIA, Va., July 30 -- United States Patent no. 12,375,792, issued on July 29, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Detection system used in product quality detection" was invented by Chia-En Chang (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection system determines to-be-tested products to be qualified or not. The detection system includes a first detection module, a sensing module, and a control module. The first detection module includes a first photographing apparatus and a first light source. The first light source being a plane light source emits light and illuminates the to-be-tested product while the first photographing apparatus ...