US Patent Issued to HON HAI PRECISION INDUSTRY on July 1 for "Method for detecting defect of images and electronic device" (Taiwanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,347,183, issued on July 1, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Method for detecting defect of images and electronic device" was invented by Shih-Chao Chien (New Taipei, Taiwan) and Chin-Pin Kuo (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting defect of images applied in an electronic device inputs flawless sample training images into an autoencoder, and calculates first latent feature by a coding layer of the autoencoder, and calculates first reconstructed images by a decoding layer, and calculates a first reconstruction error by a first preset error function. The electronic ...