US Patent Issued to HON HAI PRECISION INDUSTRY on Aug. 12 for "Magnetic field measuring method, magnetic field measuring system and magnetic field measuring apparatus" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,987, issued on Aug. 12, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei, Taiwan).

"Magnetic field measuring method, magnetic field measuring system and magnetic field measuring apparatus" was invented by Wei-Yin Chiang (New Taipei, Taiwan) and Min-Hsiu Hsieh (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic field measuring method includes: applying a magnetic field to a first particle and a second particle; generating a first output light by the first particle according to the magnetic field and a first coupling strength between the first particle and the second particle; and calculating a strength of the ...