ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,674, issued on May 27, was assigned to HITOP INSTRUMENT (JIANGSU) Co. LTD. (Suzhou, China).
"Small-sized fast cold and hot shock test devices" was invented by Dongxi Liu (Suzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A small-sized fast cold and hot shock test device is provided. The device includes a host, a test head used for cold and hot shock to a component under test by temperature control and output of compressed air, and an adjustment device for adjusting a position of the test head. The host includes a control device at least used to send temperature control data to the test head. The test head includes an eddy current mechanis...