ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,013, issued on July 15, was assigned to HITACHI RAIL Ltd. (London).
"Defect detection" was invented by Matt Jones (Southampton, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of detecting defects in a mechanical system, the method includes the steps of: a. providing a mechanical system; b. subjecting the mechanical system to random, optionally broadband, vibration by a vibration device to cause the mechanical system to vibrate and output an output vibration spectrum; c. detecting the output vibration spectrum using a vibration detection device; d. using a processing system to carry out the substeps of: i. selecting a plurality...