US Patent Issued to HITACHI on Nov. 4 for "Measurement cell manufacturing method and measurement cell" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,163, issued on Nov. 4, was assigned to HITACHI LTD..

"Measurement cell manufacturing method and measurement cell" was invented by Yuzuru Shimazaki (Tokyo), Tatsuo Nakagawa (Tokyo), Junko Tanaka (Tokyo), Akiko Shiratori (Tokyo) and Chihiro Uematsu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a technique capable of manufacturing a measurement cell having a high specimen utilization ratio in the case of using a measurement cell that introduces a specimen into a surface hole. In the measurement cell manufacturing method according to the present disclosure, a measurement cell includes a channel wall protruding from...