US Patent Issued to HITACHI on Nov. 18 for "Method to compute drift in image data before ml model inference" (Japanese, American Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,601, issued on Nov. 18, was assigned to HITACHI LTD. (Tokyo).

"Method to compute drift in image data before ml model inference" was invented by Joydeep Acharya (Milpitas, Calif.), Ravneet Kaur (San Jose, Calif.), Hidenori Omiya (Tokyo), Yusaku Otsuka (Tokyo), Takahiro Ohira (Tokyo) and Toshiki Shimizu (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for computing and detecting image data drift. The method may include retrieving first segment information of a plurality of segments from a drift database; receiving a number of images from a sensor; partitioning each of the received images into segments of a predetermined number; generatin...