US Patent Issued to Hitachi on March 4 for "Optical measurement instrument, server device, and optical measurement method" (Japanese Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,826, issued on March 4, was assigned to Hitachi Ltd. (Tokyo).

"Optical measurement instrument, server device, and optical measurement method" was invented by Takuya Kambayashi (Tokyo), Toshimitsu Noguchi (Tokyo), Shunsuke Kono (Tokyo) and Akihiro Nojima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An arithmetic expression used for estimating a target item of a specimen is more easily incorporated into an optical measurement system. An optical measurement instrument includes an optical analysis unit configured to perform an optical analysis on a specimen and measure an intensity of light as a result of the optical analysis, and an arithmetic...