US Patent Issued to HITACHI on March 18 for "Microstructural image analysis device and microstructural image analysis method" (Japanese Inventor)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,654, issued on March 18, was assigned to HITACHI LTD. (Tokyo).

"Microstructural image analysis device and microstructural image analysis method" was invented by Takayuki Kanda (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention is to provide a microstructural image analysis device and a microstructural image analysis method capable of quantifying the relations in a plurality of regions included in a microstructural image. There is provided a microstructural image analysis device for analyzing a microstructural image. The microstructural image analysis device includes a region processing unit that extracts a first region and a second...