US Patent Issued to HITACHI on June 24 for "Particle measuring device" (Japanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,210, issued on June 24, was assigned to HITACHI LTD. (Tokyo).

"Particle measuring device" was invented by Tomonari Misawa (Tokyo) and Takuya Kambayashi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a particle measuring device capable of removing particles adhering to an observation window for capturing an image of the particles and measuring an accurate particle size distribution. A particle measuring device that image-recognizes particles contained in a fluid to be measured and measures a physical quantity of the particles includes: a sample holding region that holds a sample containing the particles; an observation window dispos...