US Patent Issued to Hitachi on Dec. 16 for "Computer and visual inspection method for identifying defective products" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,532, issued on Dec. 16, was assigned to Hitachi Ltd. (Tokyo).

"Computer and visual inspection method for identifying defective products" was invented by Naoaki Kondo (Tokyo), Akira Ito (Tokyo) and Atsushi Miyamoto (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention includes image acquiring for acquiring an inspection image of a target object, pass/fail determining for determining whether the inspection image acquired in the image acquiring is the inspection image of a non-defect candidate or the inspection image of a defect candidate, overdetection determining for determining whether the inspection image determined as a defec...