ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,481, issued on Aug. 26, was assigned to HITACHI LTD. (Tokyo).

"Versatile anomaly detection system for industrial systems" was invented by Qiyao Wang (Los Gatos, Calif.), Wei Huang (Campbell, Calif.), Ahmed Farahat (Santa Clara, Calif.), Haiyan Wang (Fremont, Calif.) and Chetan Gupta (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting an anomaly in time series sensor data. The method may include identifying a noisiest cycle from the time series sensor data; for an evaluation of the noisiest cycle indicative of the anomaly being detected at a confidence level above a threshold, providing an output associated with t...