US Patent Issued to Hitachi on April 22 for "Tool wear monitoring device, tool wear monitoring system, and program" (Japanese Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,038, issued on April 22, was assigned to Hitachi Ltd. (Tokyo).

"Tool wear monitoring device, tool wear monitoring system, and program" was invented by Kenji Nishikawa (Tokyo), Yasushi Sano (Tokyo) and Ippei Kono (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a tool wear monitoring device configured to input a plurality of pieces of image data captured with a microscope camera while changing an angle, and to monitor tool wear. The tool wear monitoring device includes a data analysis unit configured to analyze image data. The data analysis unit binarizes the plurality of pieces of image data captured while changing an angle, extracts...