US Patent Issued to HITACHI INDUSTRY & CONTROL SOLUTIONS on Sept. 23 for "Operation control system for monitoring process control anomalies and applying countermeasures" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,830, issued on Sept. 23, was assigned to HITACHI INDUSTRY & CONTROL SOLUTIONS LTD. (Hitachi, Japan).

"Operation control system for monitoring process control anomalies and applying countermeasures" was invented by Yasuhiro Takahashi (Hitachi, Japan), Tomoko Ishino (Hitachi, Japan) and Nobuyuki Sonoda (Hitachi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An operation control system includes: a storing processing part configured to store collected information on abnormality in countermeasure progress information storage parts in which information on an abnormality or countermeasure information on a countermeasure to the abnormality is stored...