ALEXANDRIA, Va., June 4 -- United States Patent no. 12,320,740, issued on June 3, was assigned to HITACHI HIGH-TECH SCIENCE Corp. (Tokyo).

"Apparatus for acquiring polarized images" was invented by Hirohito Fujiwara (Tokyo) and Ryokuhei Yamazaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is an apparatus for acquiring polarized images attached to a thermal analysis apparatus including a pair of sample containers housing a measurement sample and a reference sample, respectively, and a heating furnace, configured to observe at least the measurement sample through a window or an opening of the heating furnace, and including an attachment section attached to the thermal analysis apparatus, a ...