US Patent Issued to HITACHI HIGH-TECH on Sept. 9 for "Specimen transport device, specimen analysis system, specimen pretreatment system, and specimen transport method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,149, issued on Sept. 9, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Specimen transport device, specimen analysis system, specimen pretreatment system, and specimen transport method" was invented by Yuichiro Shiga (Tokyo) and Kuniaki Onizawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a specimen transport device, a specimen analysis system, a specimen pretreatment system, and a specimen transport method that can reduce human errors as compared with the related art. There are a plurality of magnetic bodies having different inductance characteristics, and a calculation unit calculates inductance characteristic values at a ...