US Patent Issued to Hitachi High-Tech on Sept. 23 for "Measurement method, measurement system, and non-transitory computer readable medium" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,380, issued on Sept. 23, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Measurement method, measurement system, and non-transitory computer readable medium" was invented by Hiroshi Fukuda (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object is to provide a measurement system or the like that enables selection of appropriate new measurement targets by performing measurement on a limited number of measurement points.Proposed is a system including a measurement tool; and a computer system configured to communicate with the measurement tool, in which the computer system is configured to calculate, based on feature data of a plurality of l...