US Patent Issued to Hitachi High-Tech on Sept. 23 for "Connection device and automated system for inspecting specimen" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,447, issued on Sept. 23, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Connection device and automated system for inspecting specimen" was invented by Shigeki Yamaguchi (Tokyo), Masashi Endo (Tokyo) and Taichiro Yamashita (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are: a connection device with which it is possible to improve the degree of freedom in positioning of an analysis device that analyzes a specimen; and an automated system for inspecting a specimen, the system comprising the connection device. A connection device for connecting a specimen transport device that transports a specimen container in which a specimen is a...