ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,097, issued on Oct. 7, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Spectroscopic measurement device" was invented by Masahiro Watanabe (Tokyo), Kaifeng Zhang (Tokyo), Shuichi Baba (Tokyo) and Takenori Hirose (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a spectroscopic measurement device capable of improving detection sensitivity to a change in a physical property value such as expansion of a sample to which energy is applied by an infrared ray or the like. The spectroscopic measurement device includes: a stage on which a sample is to be placed; an energy source configured to generate an energy beam to be emitted to a predet...