US Patent Issued to Hitachi High-Tech on Oct. 7 for "Microstructure evaluation system and sample image imaging method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,513, issued on Oct. 7, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Microstructure evaluation system and sample image imaging method" was invented by Sayaka Kurata (Tokyo) and Ryuichirou Tamochi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A microstructure evaluation system or detecting a fluctuation caused by an imaging device, including a feature data extraction unit configured to extract first feature data from an image captured by an imaging device while changing an observation field of view on a sample; and a fluctuation evaluation unit configured to calculate a long-term fluctuation of the first feature data, return an observation...