ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,142, issued on Nov. 25, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Photoelectron emission microscope" was invented by Takeshi Morimoto (Tokyo), Momoyo Enyama (Tokyo) and Akira Ikegami (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A photoelectron emission microscope reducing preparation time for capturing a photoelectron image with high luminance and resolution. The photoelectron emission microscope includes: a sample stage on which a sample is to be placed; an excitation light source configured to irradiate the sample with excitation light; a camera configured to detect photoelectrons emitted from the sample and capture a photoelectro...