US Patent Issued to Hitachi High-Tech on Nov. 18 for "Automatic analysis system and specimen conveying method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,359, issued on Nov. 18, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Automatic analysis system and specimen conveying method" was invented by Satoshi Nakajima (Tokyo), Akihiro Yasui (Tokyo) and Takeshi Setomaru (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an automatic analysis system in which a conveying line 104 and a plurality of dispensation lines 209, 309 are disposed not to be parallel, and a device layout of analysis modules 200, 300 disposed with a specimen rack distribution module 100 therebetween is line-symmetric with respect to a straight line 100A passing through the rotation center of a standby disc 106. Accord...