ALEXANDRIA, Va., June 10 -- United States Patent no. 12,292,330, issued on May 6, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).
"Spectrometry apparatus" was invented by Kaifeng Zhang (Tokyo), Masahiro Watanabe (Tokyo) and Takenori Hirose (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a spectrometry apparatus that suppresses a reduction in usage efficiency of an irradiation energy of a light. A spectrometry apparatus of the disclosure includes a stage on which a sample is placed, an electromagnetic source that emits an electromagnetic wave, one or a plurality of optical elements that transform a spatial energy distribution of the electromagnetic wave and emit the electromagnetic wave, an...