US Patent Issued to HITACHI HIGH-TECH on May 27 for "Sample rack, adapter for sample rack, and automatic analysis device" (Japanese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,642, issued on May 27, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Sample rack, adapter for sample rack, and automatic analysis device" was invented by Masaru Miyazaki (Tokyo) and Takamichi Mori (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention is provided with: a sample rack body in which test tubes are inserted from insertion openings; a plurality of leaf springs that are provided to the sample rack body and press and hold the test tubes; and adaptors inserted from the insertion openings. The adaptors respectively have cylindrical bodies inserted from the insertion openings. The cylindrical bodies each have formed t...