US Patent Issued to HITACHI HIGH-TECH on March 4 for "Automatic analysis device and automatic analysis method" (Japanese Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,905, issued on March 4, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analysis device and automatic analysis method" was invented by Kohei Hiroki (Tokyo), Akihiro Yasui (Tokyo) and Takeshi Setomaru (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an automatic analysis device, it is possible during specimen analysis to add/deposit one rack at a time without stopping the analysis, and it is easy to ascertain the analysis sequence. The analyzer has an analysis module, a rack transport module for transporting a specimen rack in which a specimen container storing a specimen is loaded, and a control device. The rack transport module ...