US Patent Issued to HITACHI HIGH-TECH on March 18 for "Automatic analysis device and automatic analysis method" (Japanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,536, issued on March 18, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analysis device and automatic analysis method" was invented by Yuto Kazama (Tokyo), Masahiko Iijima (Tokyo) and Sakuichiro Adachi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic analysis device has a plurality of types of photometers having different quantitative ranges, and an analysis control unit for quantifying the desired component in specimens based on measurement values of one or more photometers selected from among the plurality of types of photometers. The analysis control unit: sets a switching region in an overlap region of respective ...