ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,407, issued on June 24, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Device for detecting charged particles or radiation" was invented by Laila Ambar Sari (Tokyo), Shin Imamura (Tokyo), Takumu Iwanaka (Tokyo) and Yoshifumi Sekiguchi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A charged-particle detecting device 108, 108a, 108b, 108c, 108d, 108e, 108f, 108g or a radiation detecting device 203 detects charged particles or radiation as a detection target. These detection devices are each provided with: a scintillator 109 provided with a fluorescent layer 109a that converts the detection target into light 112; a light detector 111, 111b t...