US Patent Issued to HITACHI HIGH-TECH on June 24 for "Automatic analysis device and maintenance guide method in automatic analysis device" (Japanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,655, issued on June 24, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analysis device and maintenance guide method in automatic analysis device" was invented by Masashi Akutsu (Tokyo), Satoshi Yokotsuka (Tokyo) and Hiroyuki Mishima (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an automatic analysis apparatus in which plurality of units are connected and which can perform maintenance on any unit in parallel, and a maintenance guide method for the automatic analysis apparatus. The control unit 114 causes a display unit 116 to display a maintenance guide screen 201 in which maintenance guidance (a display region for s...