US Patent Issued to HITACHI HIGH-TECH on June 17 for "Mass spectrometry device control method, mass spectrometry system, and voltage control device" (Japanese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,327, issued on June 17, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Mass spectrometry device control method, mass spectrometry system, and voltage control device" was invented by Masuyuki Sugiyama (Tokyo), Hideki Hasegawa (Tokyo), Yuki Nagaya (Tokyo), Yuichiro Hashimoto (Tokyo) and Hiroyuki Yasuda (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A mass spectrometer includes an ion source, an ion guide, a quadrupole mass filter, a detector, DC and RF power sources, and a voltage control device for controlling an acceleration voltage by controlling the power source. The voltage controller controls the acceleration voltage such that it is in...