US Patent Issued to Hitachi High-Tech on June 17 for "Charged particle gun, charged particle beam system, and lock nut" (Japanese Inventor)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,298, issued on June 17, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Charged particle gun, charged particle beam system, and lock nut" was invented by Teruaki Hasegawa (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "This charged particle gun has a bolt to which a charged particle source is attached, a nut that is screwed together with the bolt and thereby holds the charged particle source, and a nut seat surface in contact with the nut. The nut includes an inclination adjustment section whereby it is possible to adjust the angle of inclination of the charged particle source with respect to the nut seat surface, and a lock section that inh...