US Patent Issued to HITACHI HIGH-TECH on June 17 for "Automated analyzer displaying a GUI including first and second inspection information" (Japanese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,131, issued on June 17, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automated analyzer displaying a GUI including first and second inspection information" was invented by Shunsuke Sasaki (Tokyo) and Taku Sakazume (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "The automated analyzer comprises: an analysis operation unit for analyzing a reaction liquid, control unit for controlling the operation of the analysis operation unit, a storage unit for storing analysis results from the analysis operation unit and information about a consumable used by the analysis operation unit, and a display unit for displaying the analysis results and inspect...