ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,391, issued on June 10, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Particle quantifying device" was invented by Satoshi Takahashi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a particle quantifying device in which there is a wider range of the number of particles that can be accurately recognized in a particulate sample. An observation device 1 comprises an imaging camera 107 that acquires a sample image representing a particulate sample and a computer 108 that performs a computation process relating to the sample image. The computer 108 acquires a frequency domain representation of the sample image, separates the frequen...