US Patent Issued to Hitachi High-Tech on July 8 for "Sample image display system and charged particle beam apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,354,830, issued on July 8, was assigned to Hitachi High-Tech Corp. (Tokyo).

"Sample image display system and charged particle beam apparatus" was invented by Wei Chean Tan (Tokyo), Hiroyuki Chiba (Tokyo), Ryo Komatsuzaki (Tokyo) and Hirofumi Sato (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample image display system 150 displays, on a screen, a plurality of images 203 of a sample S and a symbol 205 corresponding to each of the images. The sample image display system 150 displays each symbol 205 in a different mode according to information related to the corresponding image 203."

The patent was filed on Sept. 4, 2019, under Application No. 1...