US Patent Issued to HITACHI HIGH-TECH on July 15 for "Automatic analysis device and automatic analysis method of specimen" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,077, issued on July 15, was assigned to HITACHI HIGH-TECH Corp. (Tokyo).

"Automatic analysis device and automatic analysis method of specimen" was invented by Masashi Fukaya (Tokyo) and Akihiro Yasui (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic analysis device 100 includes an electrolyte measurement unit 114 that executes internal standard solution measurement once or more at least before potential measurement of the specimen, and when the potential measurement of the specimen is continuously executed by the electrolyte measurement unit 114, a measurement operation of the internal standard solution before the potential measurem...