ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,522, issued on July 1, was assigned to Hitachi High-Tech Corp. (Tokyo).
"Computer system, dimension measurement method, and storage medium" was invented by Yutaka Okuyama (Tokyo) and Takeshi Ohmori (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer system providing a function for: extracting, from image data of a semiconductor pattern, coordinate information of a base point for measuring a dimension of a desired location of the semiconductor pattern; and measuring the dimension using the coordinate information of the base point. The computer system includes a training device in which a pose estimation model for outputting coordinate inf...